USB 3.2 doubles the data rate of previous USB specs, but makes the testing process significantly harder. Find out why in this electrical engineering podcast.

EEs Talk Tech - An Electrical Engineering Podcast

The Huge Challenge of Testing USB 3.2 – #33

Inspired by over-the-cubical-wall conversations about the changing world of electronics and electrical engineering, Daniel Bogdanoff and Mike Hoffman set out to create an electrical engineering podcast. Covering a broad range of topics from the basics of electrical engineering to the tough engineering problems of tomorrow’s technologies, Daniel & Mike bring in members of Keysight’s engineering team to provide their unique perspectives.

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EEs Talk Tech - An Electrical Engineering Podcast