Labtron XRF Spectrometer LXRF-A10 is designed for elemental analysis and non-destructive material testing, with a detection limit of 1 ppm and an elemental content range of 1 ppm to 99%. It features a built-in Si-PIN detector, a movable sample platform, and multi-element analysis capabilities. This X-ray fluorescence spectrometer is suitable for metal plating thickness measurement, plating solution analysis, RoHS testing, and electroplating applications